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Other articles related with "extended defects":
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76103 |
Qing Liao(廖庆), Bingsheng Li(李炳生), Long Kang(康龙), Xiaogang Li(李小刚) |
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Comparison of cavities and extended defects formed in helium-implanted 6H-SiC at room temperature and 750 ℃ |
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Chin. Phys. B
2020 Vol.29 (7): 76103-076103
[Abstract]
(587)
[HTML 0 KB]
[PDF 5017 KB]
(103)
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106101 |
Yi-Dan Tang(汤益丹), Xin-Yu Liu(刘新宇), Zheng-Dong Zhou(周正东), Yun Bai(白云), Cheng-Zhan Li(李诚瞻) |
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Defects and electrical properties in Al-implanted 4H-SiC after activation annealing |
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Chin. Phys. B
2019 Vol.28 (10): 106101-106101
[Abstract]
(608)
[HTML 1 KB]
[PDF 909 KB]
(217)
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